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Technology Assessment in a Globalized World: Facing the Challenges of Transnational Technology Governance

by Leonhard Hennen, Julia Hahn, Miltos Ladikas

ISBN 13: 9783031106187

Format: Paperback (288 pages)
Publisher: Springer
Published: 08 Jan 2023

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Technology Assessment in a Globalized World: Facing the Challenges of Transnational Technology Governance

by Leonhard Hennen, Julia Hahn, Miltos Ladikas, Ralf Lindner, Walter Peissl, Rinie van Est

ISBN 13: 9783031106194

Format: Paperback (284 pages)
Publisher: Springer
Published: 08 Jan 2023

Save for later